High-Performance Power Supply EDDP Power Cycling Test
EDDP refers to the total energy dissipated to produce a measurable and specific degradation indicator in the Device Under Test (DUT) during power cycling. It is an accelerated aging test method designed to evaluate the lifetime and reliability of power semiconductor modules under real operating conditions—such as frequent switching and load fluctuations.
For high-performance power supplies—including server power supplies, telecom power systems, and on-board EV chargers—the reliability of core power devices is crucial. Therefore, the EDDP test is not merely a validation tool but a core criterion in design and component selection.
Why Do High-Performance Power Supplies Emphasize EDDP Testing?
The demanding nature of high-performance power systems means their power devices must withstand extreme stress:
High Power Density: Greater thermal stress per unit volume results in higher junction temperatures and more severe temperature fluctuations.
Frequent Load Changes: Servers adjust power according to computational load, while EV chargers vary output depending on battery state—both translating directly into power cycling stress on devices.
In an actual power system, load variation is the direct cause of power cycling stress in power devices. When load increases, device current rises, losses increase, and junction temperature goes up; when load decreases, the temperature drops. These constant fluctuations—occurring every second—constitute real-world “power cycles.” The severity of load variation determines the EDDP stress level: a power supply that must handle frequent, rapid load changes must have components with a very high EDDP tolerance to ensure sufficient lifetime.
Therefore, many manufacturers perform load variation tests on finished products to verify their reliability.
Example Test Requirement from a Manufacturer
An electronic load rated at 50 V / 1080 A / 54 kW is used to generate the following pulse waveforms:
1.Load 30% → 160%, 0.34 ms / 0.4 ms, slew rate 15–30 A/µs
2.Load 20% → 160%, 0.1 ms / 0.1 ms, slew rate 30 A/µs
3.Load 70% → 130%, 0.05 ms / 0.05 ms, slew rate 30 A/µs
4.Load 0% → 200%, 50 ms / 50 ms, slew rate 15–30 A/µs
In addition to fast current slew rate capability, the load must also support short-term overload operation. Traditional electronic loads may allow overload conditions but often require long recovery intervals (up to several minutes) before the next overload event, making them unsuitable for continuous cycling tests.
ITECH IT8100 Series — Breaking Performance Barriers
The ITECH IT8100 Series next-generation programmable DC electronic load breaks through traditional limits with superior over-power handling performance. They support 1.5× short-term overpower operation, and if the average power per cycle remains within the rated range, continuous overpower cycling is possible.
This capability not only satisfies the demanding requirements of high-power applications but also reduces dependency on oversized equipment—offering a cost-effective and efficient solution for EDDP and reliability testing.
Additionally, the IT8100 Series provides up to 50 kHz dynamic load frequency, supporting Constant Current Dynamic (CCD) and Constant Resistance Dynamic (CRD) modes. Each unit achieves a current slew rate of up to 45 A/µs and a minimum response time of 8 µs, meeting the stringent needs of high-speed transient response testing in advanced power systems.
The IT8100 Series represents a new generation of graphical programmable DC electronic loads, combining advanced touchscreen design with an intuitive graphical user interface that allows users to set parameters and edit waveforms quickly and easily—greatly enhancing operational convenience and efficiency.
As a new benchmark in high power density electronic loads, the IT8100 Series achieves up to 7.2 kW of power density within just 3U height (150 V model). Utilizing fiber-optic master-slave parallel technology, the system’s total power can be expanded up to 1.8 MW, meeting the demanding requirements of high-voltage and high-current applications.
The IT8100 Series is available in 150 V, 600 V, and 1200 V voltage ranges, with single-unit power ratings from 2 kW to 64.8 kW. Featuring ultra-fast current slew rates and a rich set of operating modes—including dynamic mode, automatic test mode, and basic/advanced loading modes—the IT8100 Series delivers exceptional performance across a wide range of complex applications such as power modules, AI server power systems, fuel cells, EV chargers, power electronics, and industrial motors.
With its superior flexibility, speed, and scalability, the IT8100 Series provides powerful support for R&D, verification, and production testing in next-generation power and energy systems.
