In the past few years, due to the large demands of solar energy, photovoltaic industry has embraced high speed development in China. However, it has presented slow increasing after booming at the very beginning with less and less demands. After the ‘5.31 new policy’ has been enforced, it’s urgent to alleviate the influences of decreased demands in a short time. So enterprises should work out how to obtain technology breakthrough or reduce costs. ITECH always devotes to explore test technology in applications of photovoltaic industry. We work with photovoltaic corporations and help them to become stronger, more precise and finally reach up to top level. Lately, ITECH will bring to market new product series, IT6000B/C/D with high performance, high voltage, high power density. You’ll find in this article how they are well applied to the test of photovoltaic inverters.

Background Semiconductor manufacturers have extremely high requirements on power supply, in particular the wafer related industry with higher requirements on power supply quality. Once voltage transient drop occurs, it will not only cause unexpected damage to sensitive microcomputer automatic control devices but also interrupt the process and cause great losses. To protect sensitive devices from voltage transient drop damage, the SEMI F47 standard stipulates the tolerance level of the semiconductor processing equipment on voltage transient drop, and requires that the semiconductor processing equipment should be immune to voltage transient drop in the AC power grid.

Information age, the reliability of power supply is increasingly required. Especially in some key applications, such as data centers, communication base stations, etc., the stability of the power supply is directly related to the normal operation of the entire system.

ITECH ATE power supply is officially launched, bringing unprecedented freedom and flexibility to your test system! No longer constrained by traditional panel design, let us break the constraints and build a smarter and more flexible test system together.

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